Characteristics and capacities of the NASA Lewis Research Center high precision 6.7- by 6.7-m planar near-field scanner

Abstract

A very precise 6.7- by 6.7-m planar near-field scanner has recently become operational at the NASA Lewis Research Center. The scanner acquires amplitude and phase data at discrete points over a vertical rectangular grid. During the design phase for this scanner, special emphasis was given to the dimensional stability of the structures and the ease of adjustment of the rails that determine the accuracy of the scan plane. A laser measurement system is used for rail alignment and probe positioning. This has resulted in very repeatable horizontal and vertical motion of the probe cart and hence precise positioning in the plane described by the probe tip. The resulting accuracy will support near-field measurements at 60 GHz without corrections. Subsystem design including laser, electronic and mechanical and their performance is described. Summary data are presented on the scan plane flatness and environmental temperature stability. Representative near-field data and calculated far-field test results are presented. Prospective scanner improvements to increase test capability are also discussed