The physical basis for spectral variations in thermal infrared emittance of silicates and application to remote sensing

Abstract

The use of infrared spectroscopy for the remote characterization of planetary surfaces has received attention due to efforts in the investigation of these bodies from space. In the 8 to 14 micron region, a depression in the emittance spectra of rocks (sometimes called reststrahlen) is related to the fundamental stretching vibrations of Si-O bonds and shifts in the locations of this feature are ascribed to variations in rock composition. Thus, it should be possible to investigate, quantify, and model the relationships of reststrahlen spectral band location through silicate mineralogical composition to rock classification. This concept will be tested first through the use of laboratory-acquired data on the infrared spectra and mineralogy of selected mineral and rock samples. As a suitable classification model is developed, it will be tested through overflights of appropriate rock outcrops using the Thermal Infrared Multispectral Scanner (TIMS)