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Reflectance spectra of mafic silicates and phyllosilicates from .6 to 4.6 microns

Abstract

The results of spectral measurements for mafic silicates are given. The study provided valuable spectral reflectance information about mafic silicates and phyllosilicates in the 2.5 to 4.6 micron wavelength region. It was shown that the reflectance of these materials is strongly affected by the presence of H2O and OH. Therefore, the identification of these absorbing species is greatly enhanced

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