Spatial conductivity measurements on high T(sub c) superconducting films

Abstract

High T(sub c) superconducting thin and thick films have potential applications in future NASA flight projects. In anticipation of film use, the Materials Branch is developing a nondestructive, non-contact method of measuring the spatial variation of conductivity across a film sample. This method uses a computer-controlled, X-Y positioning table to scan a conventional eddy current probe across the surface of a film. The induced changes in impedance caused by variations in film conductivity are recorded during the scanning process. Ultimately the two-dimensional data set is displayed using imaging equipment on a personal computer