Description and operation of a microwave reflectance measurement system

Abstract

A recent effort at the NASA Lewis Research Center (LeRC), Microwave System Laboratory was to develop the capability to perform farfield reflectance measurements. This effort has resulted, to date, in a system that can perform X-band, monostatic, measurements of test objects. The system and the measurement procedure are described. Data are presented which assists in the evaluation of the quality of the measurements obtained with the system