Multiwavelength pyrometry for nongray surfaces in the presence of interfering radiation

Abstract

A NASA developed multiwavelength pyrometry technique for nongray surfaces was extended to also measure surface temperature in the presence of interfering radiation. This radiation is produced by heat lamps used to raise the temperature of the surface. The necessary instruments are a spectral radiometer, an auxiliary radiation source, and a computer. Four radiation spectra are recorded: (1) the unobstructed spectrum characterizing an auxiliary radiation source; (2) the unobstructed spectrum characterizing the interfering radiation; (3) the radiation spectrum consisting of surface emission plus the interfering radiation; and (4) a spectrum consisting of the radiations of (3) plus the reflected radiation due to the incidence of the auxiliary radiation source on this surface. With these spectra, application of two variable, nonlinear, least squares, curve fitting computer software determines the surface temperature and the spectral emissivity. Use of the method to measure the surface temperature of silicon carbide under a simulated interference condition is shown at a low temperature just above ambient. The instrumentation necessary to extend the method to elevated temperatures is discussed