In certain cases a space-borne optical instrument with a dielectric window requires a transparent conductive coating deposited on the window to remove the electrostatic charge collected due to the bombardment of ionized particles. Semiconductor and metal films are studied for use as transparent conductive coatings for the front window of far ultraviolet camera. Cr is found to be the best coating material. The theoretical search for the semiconductor and metal coating materials and experimental results for ITO and Cr films are reported

Keffer, Charles E.

Kim, Jongmin

Park, Jung HO

Torr, Douglas G.

Wilson, Michele M.

Zukic, Muamer

English

NASA Technical Reports Server

NASA-CR-194632 /_//5
Transparent conductive coatings
in the far ultraviolet
Jongmin Kim, Muamer Zukic, Jung Ho Park, Michele M. Wilson,
Charles E. Keffer, and Douglas G. Ton"
Department of Physics, The University of Alabama in Huntsville
Optics Building, Suite 300, Huntsville, AL. 35899
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ABSTRACT
In certain cases a space-borne optical instrument with a dielectric window requires a transparent
conductive coating deposited on the window to remove the electrostatic charge collected due to the
bombardment of ionized particles. Semiconductor and metal films are studied for use as transparent
conductive coatings for the front window of far ultraviolet camera. Cr is found to be the best coating
material. The theoretical search for the semiconductor and metal coating materials and experimental
results for ITO and Cr films are reported.
1. INTRODUCTION
Some optical instruments flown on orbiting satellites have exterior dielectric windows. Due to
bombardment by ionized particles, electrostatic charge accumulates on the window which may cause
undesirable effects. This prompted investigation into the properties of a conductive transparent coating
for use as a surface layer to remove the undesirable electrostatic charges.
Transparent conductive coatings combine high optical transmission with good electrical
conductivity and have a number of interesting applications : liquid crystal and gas discharge displays,
front electrodes for solar cells, heating stages for optical microscopes, Ig reflectors, phofoconduCtors in
television camera vidicons, Pokell cells for laser Q-switches, and antistatic coatings.
Combining the properties of transparency and conductivity in the same coating material is not
trivial and is only possible with certain semiconductors and with very thin and very low electrically
resistant metal films. Thin metal films are widely applied as Ig reflectors, but are not extensively used as
transparent semiconductors. ! In general, semiconducting oxides exhibit better electrical and optical
properties than thin metal films. Also, metal films are not very resistant to abrasion and other forms of
mechanical damage.
For applications in which transparency is much more important than electrical conductivity, SnO 2
is usually employed because its absorption edge occurs further into the UV than other oxide materials. In
other classes of devices, in which transparency must be sacrificed for maximum conductivity, indium tin
oxide (ITO) (lnzO3;Sn) is ordinarily used because it yields the highest conductivity and because it can be
etched easily.
(NASA-CR-19t,632) TRANSPARENT N94-16024
CONDUCTIVE COATINGS IN THE FAR
ULTRAVIOLET (Alabama Univ.) 8 p
uncl as
G3/T4 0191210
https://ntrs.nasa.gov/search.jsp?R=19940011551 2020-06-16T20:32:21+00:00Z
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So far studies about transparent conductive coatings have focused only on the visible and IR
regions. In the far ultraviolet (FUV) region, all optical materials are absorbing and reflection optics have
been widely used. Therefore, a transparent conductive coating in the FUV region is a new problem to be
addressed. Published materials for transparent conductive coatings in the visible and IR region were
reviewed by Holland 2 in 1958 and Vossen t in 1977. These papers served as a starting point in our
research to find FUV transparent conductive coatings.
2. INSTRUMENTAL REQUIREMENTS
The FUV imager 3 for the International Solar Terrestrial Physics (ISTP) mission is designed to
image four features of the aurora : O I lines at 130.4 nm and 135.6 run and the N 2 Lyman-Birge-Hopfield
(LBH) bands between 140 nm -160 nm (LBH short) and 160 nm -180 nm (LBH long). The optical
system contains three electro-mechanical devices : an entrance aperture door, a filter wheel, and a folding
mirror. The purpose of the entrance door is to close the instrument during non-operating conditions
(integration, launch, thruster bums), and to protect it. Because this instrument is used at altitudes
between two and nine earth radii (RE), the entrance door is exposed to bombardment by ionized particles
and no buildup of electrostatic charge is allowed. Also, in the event it should fail in the closed position, it
is designed to work as a broad passband window for the entire FUV region. Our research goal was to
develop a conductive coating to meet the following specifications.
a) substrate : 3" diameter, 0.125" thickness MgF 2 window
b) transmittance : > 50 % for entire FUV region
c) resistance : < 10 kD./l'l
d) should be stable chemically and mechanically
3. SEMICONDUCTOR MATERIALS
3.1. Conductivity
Oxide films, deposited by whatever means, appear to grow on oxide substrates as continuous
films from the outset of deposition and do not have the island structure typically found in metal films.
However, due to a smaller number of carriers compared to metal films, thicker films are required to
achieve the same conductivity. Therefore, 200 nm to 400 run thickness is usually required for
semiconductor transparent conductive films in the visible and IR region. 4 For an antistatic film, less
conductivity is required. Haas et. al. 5 achieved 700 D./I'I with 36 nm In203 film and 6 kD,/l'l with 31 nm
In203 +SnO 2 film for a space temperature control application.
The electrical properties of semiconductor films are very dependent on stoichiometry and the
incorporation of impurities, either purposeful or inadvertent. Also they are relatively unstable, chemically,
and depend on the fabrication parameters; fabrication process, starting material, substrate temperature,
deposition rate, and annealing temperature and time. For nominally equivalent materials, even similar
processes often result in quite different properties.
3.2.Transmittance
Previously reported studies about the optical properties of oxide semiconductor coatings have
focused on the visible and Ig regions where oxides have low absorption. The lowest wavelength
reported was 200 nm. Hass et. al. 5 measured their InzO 3 and In203 +SnO 2 coatings prepared by
evaporation and sputtering down to this wavelength. They got 25% transmittance for a 36 nm InzO 3 film
and 23 % with a 31 nm In203 +SnO 2 film at 200 nm. Their spectral measurement results showed that
there was less transmittance at the shorter wavelength.
Dobrowlski et. al. 4 reported optical constants of their ITO films (thickness 184 nm - 412 nm)
formed by ion-assisted deposition down to a wavelength of 400 nm. At 400 rim, the absorption
coefficients were 0.04 - 0.05, but increasing with a very steep gradient.
These prereponed results showed that oxide semiconductors are very absorbing below 400 rim.
Therefore, we need a very thin film to achieve the transmittance requirement.
3.3. Experimental results on the ITO coating
R.F-sputtering was used to fabricate ITO coatings to test the possibility of using semiconductor
antistatic films in the FUV region. ITO was selected as a trial material because it is reported to have the
lowest resistance and the required conductivity could be achieved with minimum thickness. The
sputtering target material was 99.99% {(In203)91% (SNO2)9%} supplied by Angstrom Sciences. The
initial vacuum was 4 - 5 X 10 "5 tOrT and the Ar gas flow inlet was set to reach a vacuum of 5 X 10 .2 ton"
during the sputtering. The oxygen valve was kept closed and the substrate was not heated.
Before deposition onto the MgF 2 substrate, masked and unmasked Pyi'ex 1/2" substrates were
used for testing. We used the masked Pyrex coating to measure the thickness with a Talystep profiler and
found the deposition rate to be 8 nm/minl This deposition rate was used to control the thicknesses
afterwards keeping the parameters the same except for deposition time. The unmasked Pyrex substrate
was used to measure the square resistance by the method of reference 6. In a 4 minute sputtering time,
we obtained 5.7 kD./rl resistance which is very similar to Hass et. al.'s 5 result.
32 nm and 64 nm coatings are deposited on 1/2" diameter and 0.125" thickness MgF 2 substrates
for optical measurements. Our optical measurement system which is located at the NASA Marshall
Space Flight Center is explained elsewhere, v The transmittance at normal incidence and the reflectance at
a 6 ° angle of incidence are shown in Figure 1. The reflectance remained around 15% through the entire
FUV region and the transmittance decreased monotonically to the short wavelength side. The absorption
loss increases at shorter wavelengths. This result seems consistent with Hass et. al.'s s and Doborowalsky
et. al.'s 4 results. It is evident that ITO is not a good material for transparent conductive coatings in the
FUV region. With these disappointing results further experiments to change the deposition parameters
were abandoned.
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WAVELENGTH [nml
Figure 1. Measured transmittances and reflectances of 32 run (solid lines) and 64 nm
(dotted lines) ITO coatings on MgF 2 substrates.
4. METAL COATINGS
4.1. Conductivity
Metal films that have been studied for transparent conductive coating applications include • Au,
Pt, Pd, Ag, Cu, Fe, and Ni. I However, Au is predominantly used. 8 Au is a noble metal that is chemically
stable and has a very low electrical resistance. 9
The most important factor for the conductivity of a thin metal film is island formation. Since, in
nearly every case, metal atoms arrive with energies greater than kT (where T is the substrate
temperature), it is found that some of the atoms reevaporate, some are directly reflected from the
surface, and some lose their energy by moving about the substrate surface until a small cluster, or island,
is formed at a site occupied by a nucleus. As the film gets thicker, there is a coalescence of the islands
and a continuous film is obtained.
The implication of an island structure to transparent conductors is threefoid.l First, the resistivity
of such films is very high. Second, if the islands become quite large, they act to scatter incident light,
rather than transmit it. Third, all other things being equal, a thicker film must be deposited to obtain
sufficient electrical conductivity, but this results in more light absorption loss. Therefore, a thin
continuous film material is better for this purpose than those materials which have lower bulk resistance
Sennett and Scott _° observed the structure of evaporated films of eight different metals in an
electron microscope. They found that for Au and Ag, the thickness for which the aggregation began to
merge was approximately 18 rim. With the resolution obtainable in their electron microscope, a Cr film
asthin as2 nmappearedto be continuous• Therefore, we selected Cr as the best coating material to get
a required conductivity with a minimum thickness.
4.2. Transmittance
We attempted to theoretically estimate the transmittance using the optical constants of metal
coating materials found in references 11 and 12. The transmittance, reflectance, and absorptance can be
calculated by the standard matrix method with known optical constants of the film and substrate and the
thickness of the film. _3 The calculated transmittances for 2 run thickness of Pt, Au, Pd, Ag and Cr films
on MgF 2 substrates are shown in Figure 2. We used the optical constants for a MgF z substrate from
reference 14. As we can see there is little difference in transmittance for candidate materials in the FUV
region. The optical constants of our candidate materials do not differ very much over the entire FUV
region• Therefore, the reflectances from the top surface of the film, assuming very thick films, are similar
and the absorption loss plays the critical role in determining the transmittance. Apparently, the extinction
coefficients ( ie. the imaginary part of optical constant ) are all of the same order of magnitude.
90
85
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65
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°
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120 130 140 150 160 170 180 190 200
WAVELENGTH (nm)
Figure 2. Calculated transmittances for the 2 nm thickness metal films on MgF z substrates "
Pt (dashed and dotted line), Au (solid line), Pd (dotted line), Ag (dashed line), and
Cr (dashed and double dotted line).
If we neglect the interference effect between multiple reflected waves in the thin film, the ratio of
the transmitted light intensity I to the light intensity Io is given by the relation •
I= exp(_4.___kd)
Io
(l)
Because the values of k are close to 1, the thickness, d, should be smaller than 6 nm to get Ill o > 0.5 for
a wavelength of 120 rim. Au and Ag are not suitable for our purposes.
4.3. Experimental results on the Cr coating
For reason explained in section 4.1, Cr was selected as our trial material. Cr is fairly inert
chemically. Because of its high corrosion resistance, it has been vacuum evaporated to form mirrors on
glass, used for electroplated or evaporated cathodes in Geiger counters with chemically active gas fillings,
and as electrodeposited anti-corrosion layers for the external mountings of electron tubes. 9
We deposited Cr by the evaporation method with an e-beam gun in a 2 X 10.5 ton" vacuum. The
source material was 99.9 % granulate type supplied by Balzers. In order to get good adhesion, the
substrate was heated to 200 °C and the deposition rate was slow.( 4 nm/min ) Before deposition on the
MgF 2 substrate, a Pyrex substrate was used to find the film thickness which satisfied the conductivity
requirement. The thickness and deposition rate were monitored by a Quartz crystal monitor which was
calibrated using the Talystep thickness profiler.
It was found that only a 1 nm thickness Cr coating had good conductivity, with 2.15 kD./0 of
resistance. We monitored the change of the resistance of the Cr coating ( thicknesses of 1 run and 2 am)
which had been kept on a lab shelf without any special care. We measured the square resistance once a
week for the first three months and once a month afterward. There has been no change in the resistance
in 6 months. This also means that the coatings adhere so well that the probes for the resistance
measurement do not make any serious scratches.
Figure 3 shows the transmittance measurements of the 1 nm and 2 nm Cr coatings. The
transmittance of the 1 nm film satisfies the requirement but has a very low transmittance compared to the
calculated transmittance. The reason can be explained by four possibilities. First, the optical constant we
used from the reference is different from that of our coating material. Second, the coatingis oxidized and
has different properties than pure Cr. Third, the absorption of the substrate and the reflection from the
bottom surface of the substrate are not included in the calculation. Fourth, scattering loss is not
calculated.
5. SUMMARY
ITO and Cr thin film materials were tried as antistatic coatings for a FUV camera window.In the
ITO case, at least a 32 nm thickness was required to achieve the desired resistance and it had a severe
absorption loss so that it could not be used as a transparent conductive window material. Instead, Cr
films were found to be good for this purpose. Only 1 am film thickness was required to provide
conductivity and the transmittance was higher than 50 % between the wavelengths of 123 nm and 220
nm. Our Cr coating did not show signs of aging or deterioration for six months and also had good
mechanical adherence.
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60
55
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45
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35
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25
2O
120 130 140 150 160 170 180 190 200 210
WAVE LENGTH (ran)
Figure 3. Measured transmittances of 1 nm (solid line) and 2 nm(dotted line)Cr coatings on
MgF z substrates.
6. ACKNOWLEDGMENTS
This work was supported by NASA contract NAS8-38145. The authors appreciate the help of Y.
Li and G. S. Martin in the Center for Applied Optics at the University of Alabama in Huntsville (UAH) !n
using the sputtering system. The first author would like tO thank the Agency for Defense Development of
Korea and the Physics Department of UAH for the graduate student assistantship received during this
study.
7. REFERENCES
1. J. L. Vossen, "Transparent Conducting Films", in Phys. Thin Films, G. Hass, M. H. Francombe, and
R. W. Hoffman eds. Voi. 9, pp. l, Academic Press, New York, 1977.
2. L Holland, Vacuum Deposition of Thin Films, pp. 491, Chapman & Hall, London, 1963.
3. D. G. Tort, M. R. Ton', M. Zukic, J. Sparta, and R. B. Johnson, "The Ultraviolet Imager(UVI) for
ISTP', in Instrumentation for Planetary and Terrestrial Atmospheric Remote Sensing, S
Chakrabarti ed., Proc. SPIE, Vol. 1745, pp. 61, 1992.
4. J. A. Dobrowolsld, F. C Ho, D. Menagh, g. Simpson, and A. Waldorf, "Transparent, conducting
indium tin oxide films formed on low or medium temperature substrates by ion-assisted
deposition", Appi. Opt., 26, 24, pp. 5204, 1987.
5. G. Hass, J. B. Heaney, and A. g. Tott, "Transparent electrically conducting thin films for spacecraft
temperature control application", Appl. Opt., lg, 10, pp.148g, 1979.
6. M. Ohring, The Materials Science of Thin Films, chi. 10, Academic Press, Boston, 1992.
7. C. E. Keffer, M. R. Ton', M. Zukic, J. F. Spann, D. G. Ton', and I. Kim, "Radiation Damage Effects in
Far Ultraviolet Filters and Substrates", in Passive Materials for Optical Elements H, G W.
Wilkerson ed., Proc. SPIE, Vol. 2011, 1933.
8. H. K. Pulker, Coating on Glass, Ch. 6, Elsevier, Amsterdam, 1984.
9. W. Espe, Materials of High Vacuum Technology, Vol. l, Pergamon Press, Oxford, 1966.
10. R. S. Sennett and G. D. Scott, "The Structure of Evaporated Metal Films and Their Optical
Properties", J. Opt. Soc. Am., 40, 4, pp.203, 1950.
11. D. W. Lynch and W. R. Hunter, "Comments on the Optical Constants of Metals and an Introduction
to the Data for Several Metals", in Handbook of Optical Constants of Solids, E. D. Palik ed.,
Academic Press, Orlando, 1985.
12. D. W. Lynch and W. R. Hunter, "An Introduction to the Data for Several Metals", in Handbook of
Optical Constants of Solids II, E. D. Palik ed., Academic Press, Orlando, 1991.
13. M Born, and E. Wolf, Principles of Optics, 6th ed., ch. I, Pergamon, Oxford, 1980.
14. M. Zukic, D. G. Ton., J. F. Spann, and M. R. Ton-, "Vacuum ultraviolet thin films 1: Optical
constants of BaF 2, CaF 2, LaF 3, MgF 2, AI203, HfO 2, and SiO 2 thin films", Appl. Opt., 29, pp.
4284, 1990.


Transparent conductive coatings in the far ultraviolet

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