Strain effects on epitaxial thin films of LaNiO3 grown on different single
crystalline substrates are studied by Raman scattering and first-principles
simulation. New Raman modes, not present in bulk or fully-relaxed films, appear
under both compressive and tensile strains, indicating symmetry reductions.
Interestingly, the Raman spectra and the underlying crystal symmetry for
tensile and compressively strained films are different. Extensive mapping of
LaNiO3 phase stability is addressed by simulations, showing that a variety of
crystalline phases are indeed stabilized under strain which may impact the
electronic orbital hierarchy. The calculated Raman frequencies reproduce the
principal features of the experimental spectra, supporting the validity of the
multiple strain-driven structural transitions predicted by the simulations.Comment: 18 pages, 7 figure