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unknown
Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.
Authors
Luz María Balado Suárez
Joan Figueras Pàmies
Álvaro Gómez Pau
Ricard Sanahuja Moliner
Publication date
1 January 2012
Publisher
Abstract
Postprint (published version
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UPCommons
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oai:upcommons.upc.edu:2117/179...
Last time updated on 17/04/2020
UPCommons. Portal del coneixement obert de la UPC
See this paper in CORE
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oai:upcommons.upc.edu:2117/179...
Last time updated on 16/06/2016
