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Reliability Investigation and Testing System Development of MEMS Devices

Abstract

目前MEMS器件已经在很多领域都有广泛的应用,与其他产业相比,其产量却十分有限,而造成这种商业化瓶颈的主要原因是技术供应商在MEMS器件的可制造性、可测试性、可靠性等方面的解决方案能力不足。鉴于MEMS器件的门类、品种繁多、所用的敏感材料各异以及MEMS制造技术的多样性和复杂性,本论文则主要针对两种典型的MEMS器件(RFMEMS开关与电容式MEMS压力传感器)进行相关的研究,为MEMS器件更进一步的发展提供技术的积累。 电容式RFMEMS开关的商业化一直受阻于可靠性问题:开关电介质的充电效应引起开关致动部件的粘连现象。本文中,为了研究开关电介质的充放电机制,我们建立一个新的基于金属-绝缘体...At present, MEMS devices have a huge potentison to be widely used in many fields. Compared with other industries, its production is very limited. The bottleneck for mass production and application of MEMS devices is manufacturability, testability and reliability. For the diversity of MEMS devices and related material, and the complexity of manufacturing technology, it is impossible to characteriz...学位:工学硕士院系专业:物理与机电工程学院机电工程系_精密仪器及机械学号:1992006115186

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