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The Study of Metal/4H-SiC Schottky Contacts

Abstract

碳化硅(SiC)由于其较宽的带隙(),较大的击穿电场(),较高的电子饱和漂移速率()和较大的热传导率(),在制作高温、高频、大功率和抗辐射器件方面具有巨大优势,被认为是最有前景的宽带隙(≤≤)半导体材料之一。4H-SiC具有比6H-SiC更宽的带隙以及更高的电子迁移率,随着高质量单晶材料制备技术上的突破,它被认为是大功率器件方面最有前途的SiC材料。而对于碳化硅材料在半导体电子器件中的运用,控制得到一个良好的金属-半导体界面是非常必要的。为此,人们对金属/SiCSchottky接触进行了大量的工作,但大多数工作都集中在3C-SiC和6H-SiC上面,而对于金属/4H-SiCSchottky接触...Silicon carbide is a promising wide bandgap semiconductor material for high-temperature, high-power, high-frequency and radio resistance device applications because of its wide bandgap( ), high critical electric field( ), high saturated carrier velocity and high thermal conductivity( ). Compared with 6H-SiC, 4H-SiC has larger bandgap and higher saturated carrier velocity. It is necessary to get a ...学位:理学硕士院系专业:物理与机电工程学院物理学系_凝聚态物理学号:20012403

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