'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Abstract
The rectangular dielectric waveguide (RDWG) technique
has been developed for the determination of the dielectric
constant of materials from effective refractive index measurements in the Q andWbands. This paper describes the use of an optimization method in conjunction with the RDWG technique for the determination of both the dielectric constant and loss tangent of materials at Ka-Band. The effect of the uncertainty in the measured
sample thickness is presented