根据界面双层电容值可用来判定自组膜的存在 ,也能得到膜的几何厚度 ;但不能说明自组膜的完美程度 .由跨膜电子转移的速度常数 ,可以得到自组膜的电化学表观有效厚度 ,并定量描述非电活性的自组膜 (单分子层膜或双层膜 )中“倒塌”缺陷的程度 .二者数值不同但不矛盾 ,通过计算说明了自组膜中小面积的“倒塌”缺陷决定了跨膜电子转移的速度常数 ,但对自组膜电容的影响不大 .The geometrical thickness, which was obtained from the capacitance of membrane, can be used to characterize the existence of membrane. The apparent effective thickness, which is analyzed from the electron transfer constant of transmembrane, can be used to determine the degree of “collapsed" of molecules. Though the two thicknesses were different in value, there was no contradiction. The influence on the geometrical thickness is little, but the effect to the apparent effective thickness is great from the small “collapsed" area in the membrane from the given calculation.作者联系地址：复旦大学化学系!上海200433,河北科技大学基础部,河北师范大学化学系!河北石家庄050016Author's Address: Dept. of Chem., Fudan Univ., Shanghai 200433 LI Jun xin TONG Ru ting Dept. of Chem.,Hebei Normal Univ.,Shijiazhung 050016,Chin
