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自组装金团簇电极库仑台阶现象和电化学阻抗谱研究
Authors
周剑章
文莉
林仲华
翁少煌
Publication date
10 February 2008
Publisher
Abstract
采用示差脉冲伏安法研究了自组装单层保护金纳米团簇(C8AuMPC)在常温下二氯甲烷溶液中的量子化电容充电效应.研究结果表明,该团簇在-0.8~0.8V电位范围内有4对明显的量子化电容充电峰.同时采用电化学阻抗谱对C8AuMPC修饰金电极体系的界面结构进行了表征,研究结果表明,MPC自组装层存在两个界面,即金电极-MPC层界面和MPC层-溶液界面;这两个界面的界面电容在MPC的零电荷电位(ca.-0.2V)附近均基本保持不变,随着电位正移或负移到一定程度,界面电容发生变化.进一步利用双隧道结金属岛库仑阻塞效应理论讨论了已有报道中对MPC量子化电容充电的理论分析结果,并证明电化学阻抗谱也是研究MPC量子化电容充电效应的有效方法.另外,用示差脉冲伏安法及循环伏安法研究了电活性物种二茂铁对C8AuMPC量子化电容充电的影响,发现溶液中的电活性物种对MPC层-溶液界面的电子传递的贡献可以忽略,表明该界面的电子传递主要发生在纳米粒子之间
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Last time updated on 16/06/2016