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荧光分析法测定金属铝箔中的微量镓
Authors
卢泽聪
许金钩
顾群
黄贤智
Publication date
2 March 1987
Publisher
Abstract
Ga~(3+)与Al~(3+)两者离子半径相近,化学性质类似,因此镓是金属铝中常见的杂质之一。荧光法是金属铝中微量镓测定的常用方法。应用表面活性剂的,见于镓-荧光镓(或其同系物)测定体系。8羟基喹啉(Oxine)曾用于硅酸岩中微量镓的萃取-荧光测定。本文研究了Ga~(3+)-Oxine-表面活性剂体系荧光测定的合适条件,并应用于金属铝箔中微量镓的测定
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Last time updated on 16/06/2016