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ICP-AES初级专家系统中的谱线模拟
Authors
应海
杨芃原
王小如
黄本立
Publication date
25 February 1996
Publisher
Abstract
本文阐述了ICP-AES初级专家系统中谱线模拟的理论基础,模拟了Ca、Mg和Al在LTE和non-LTE情况下的离子线与原子线,证明在non-LTE条件下,离子线与原子线的强度比增强了,比LTE条件下的结果更接近实际扫描谱图。本研究模拟计算了Ca和Mg离子线的跃迁上能级能量对离子线强度的影响
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Last time updated on 16/06/2016