Quantitative EDS analysis in the SEM applying the XPP procedure

Office National d'Etudes et de Recherches Aerospatiales (ONERA), 92 - Chatillon (France); Pichoir, F.; Pouchou, J.L.

Quantitative EDS analysis in the SEM applying the XPP procedure

Authors: 92 - Chatillon (France) Office National d'Etudes et de Recherches Aerospatiales (ONERA)
F. Pichoir
J.L. Pouchou
Publication date: 1 January 1990
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Abstract

Tire de XIIth International congress for electron microscopy, Seattle (Calif.), August 12-18, 1990SIGLEAvailable at INIST (FR), Document Supply Service, under shelf-number : 22419, issue : a.1990 n.99 / INIST-CNRS - Institut de l'Information Scientifique et TechniqueFRFranc

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