We investigate a thin Sn film grown at elevated temperatures on the fivefold surface of an icosahedral AlCuFe quasicrystal by scanning tunneling microscopy (STM). At about one monolayer coverage, the deposited Sn is found to form a smooth film of height consistent with one-half of the lattice constant of the bulk Sn. Analysis based on the Fourier transform and autocorrelation function derived from high-resolution STM images reveals that Sn grows pseudomorphically and hence exhibits a quasicrystalline structure
