Active noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation (>~ 200 kHz; ~ 1 nm) is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system (50 kHz). We call this mode "gamble mode" or "resonance contact.
