SEE characterization of the AMS 0.35 µm CMOS technology

Abstract

Trabajo presentado al Radiation Effects on Components and Systems celebrado en Oxford del 23 al 27 de septiembre de 2013.This work presents experimental results for the single-event effects characterization of a commercial (Austria Microsystems) 0.35 µm CMOS technology. It improves and expands previous results. The knowledge gained is being applied in the development of a RHBD digital library.Peer Reviewe