低能重离子注入麦胚引起深层细胞损伤的一种可能机制

Abstract

讨论了低能重离子注入麦胚造成深层细胞损伤主要是注入离子与小麦组成各元素发生相互作用后的次级过程中产生了特征Ｘ射线。以能量较高（３．５８９ｋｅＶ）、强度相对贡献较大的钾元素为例，当强度减弱至原来的２－１０时，其穿越麦胚深度可达３７０μｍ，可谓是“长射程”。小麦种子在深层能受到低能离子注入的影响，可能正是由于这种次级过程的“长射程效应”。The cell damage in deep layer of wheat embryo caused by the implanted low-energy heavy-ions can be attributed to the characteristic X-rays as a result of the interaction between the implanted ions and the component elements of wheat.Taking potassium as an example,its 3.589 keV characteristic X-rays can penetrate to a much deeper region in wheat embryo.At a depth of up to 370 μm its intensity drops only by a factor of 1000.It is the "long range effect" caused by the secondary process of heavy-ions that seems国家自然科学基