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低能高电荷态Ar~(q+)(q=12,13)离子诱发钼L壳层X射线强度的研究(英文)
Authors
崔莹
张小安
+11 more
张毅
张红强
徐徐
徐进章
杜娟
杨治虎
王博宇
肖国青
胡碧涛
邵剑雄
陈熙萌
Publication date
Publisher
Abstract
本文报导了低能高电荷态Arq+(q=12,13)离子诱发的钼L壳层X射线强度随入射粒子能量的变化趋势,研究表明当入射粒子能量高于220 keV时,钼L壳层X射线强度有明显增加的的趋势.同时,我们提出了一个简单的模型去估计这种趋势随入射能量的变化.模型计算的结果与实验值符合的比较好
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Last time updated on 24/05/2016