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Measurement of the effect of plasmon gas oscillation on the dielectric properties of <i>p-</i> and <i>n-</i>doped Al<sub>x</sub>Ga<sub>1−x</sub>N films using infrared spectroscopy
Authors
B. Damilano
J. Brault
+6 more
J. Jabbour
J. Massies
M. Kazan
M. Tabbal
N. Rahbany
R. Tauk
Publication date
7 August 2013
Publisher
AIP Publishing
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Abstract
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info:doi/10.1063%2F1.4817172
Last time updated on 21/04/2021
