A numerical framework for pattern formation modeling of film-substrate systems

Abstract

We propose a whole numerical framework to study the buckling problems of film-substrate systems: from 2D to 3D modeling, from classical to multi-scale perspective. The main objective is to apply advanced numerical methods (path-following techniques, bifurcation indicators, bridging techniques, multi-scale analyses, etc.) for multiple-bifurcation analyses of film-substrate buckling problems. Through incorporating these numerical methods with FEM, it can predict the occurrence and post-bifurcation evolution of wrinkling patterns in various boundary and loading conditions as well as complex geometry configurations

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