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Spectroscopic Ellipsometry Study of Spark Plasma Sintered Nano Silver

Authors
Publication date
6 June 2016
Publisher
HAL CCSD

Abstract

International audienceSpark Plasma Sintered (SPS) silver layers were studied by Spectroscopic Ellipsometry (SE) using an M-2000V spectroscopic ellipsometer from J. A. Woollam Co., Inc. which operate in rotating compensator mod

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