This paper explores and analyzes two randomized designs for robust Principal
Component Analysis (PCA) employing low-dimensional data sketching. In one
design, a data sketch is constructed using random column sampling followed by
low dimensional embedding, while in the other, sketching is based on random
column and row sampling. Both designs are shown to bring about substantial
savings in complexity and memory requirements for robust subspace learning over
conventional approaches that use the full scale data. A characterization of the
sample and computational complexity of both designs is derived in the context
of two distinct outlier models, namely, sparse and independent outlier models.
The proposed randomized approach can provably recover the correct subspace with
computational and sample complexity that are almost independent of the size of
the data. The results of the mathematical analysis are confirmed through
numerical simulations using both synthetic and real data
