Recently, x-ray illumination, using synchrotron radiation, has been used to
manipulate defects, stimulate self-organization and to probe their structure.
Here we explore a method of defect-engineering low-dimensional systems using
focused laboratory-scale X-ray sources. We demonstrate an irreversible change
in the conducting properties of the 2-dimensional electron gas at the interface
between the complex oxide materials LaAlO3 and SrTiO3 by X-ray irradiation. The
electrical resistance is monitored during exposure as the irradiated regions
are driven into a high resistance state. Our results suggest attention shall be
paid on electronic structure modification in X-ray spectroscopic studies and
highlight large-area defect manipulation and direct device patterning as
possible new fields of application for focused laboratory X-ray sources.Comment: 12 pages, 4 figure