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Redundancy or GaAs? Two different approaches to solve the problem of SEU (Single Event Upset) in a digital optical link
Authors
M L Andrieux
B Dinkespiler
+8 more
L Gallin-Martel
J M Lundqvist
M Pearce
F Rethore
S Rydström
R Stroynowski
S Xie
J Ye
Publication date
1 January 2000
Publisher
CERN
Doi
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Abstract
Abstract is not available.
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HAL AMU
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oai:HAL:in2p3-00008140v1
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oai:cds.cern.ch:478878
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HAL-IN2P3
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Hal - Université Grenoble Alpes
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