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Single event upset tests of an 80Mbit/s optical receiver
Authors
6th Workshop on Electronics for LHC Experiments
Guy Berger
+6 more
F. Faccio
K. Gill
M. Huhtinen
A. Marchioro
P. Moreira
F. Vasey
Publication date
1 January 2000
Publisher
'Institute of Electrical and Electronics Engineers (IEEE)'
Doi
Abstract
Abstract is not available.
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CERN Document Server
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oai:cds.cern.ch:478877
Last time updated on 30/10/2014
DIAL UCLouvain
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oai:dial.uclouvain.be:boreal:3...
Last time updated on 14/05/2016
