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Combined ionizing radiation & electromagnetic interference test procedure to achieve reliable integrated circuits
Authors
César Augusto Missio Marcon
Fabian Luis Vargas
+5 more
Marcilei da Silva
Nemitala Added
Nilberto H. Medina
Paulo Villa
Roger Goerl
Publication date
31 August 2021
Publisher
Doi
Abstract
Abstract is not available.
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oai:meriva.pucrs.br:10923/1814...
Last time updated on 28/02/2025
