We report new experimental studies to understand the physics of phonon
sensors which utilize quasiparticle diffusion in thin aluminum films into
tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic
TES physics and a simple physical model of the overlap region between the W and
Al films in our devices enables us to accurately reproduce the experimentally
observed pulse shapes from x-rays absorbed in the Al films. We further estimate
quasiparticle loss in Al films using a simple diffusion equation approach.Comment: 5 pages, 6 figures, PRA

Brink, P. L.

Cabrera, B.

Cherry, M.

Kreikebaum, J. M

Moffatt, R.

Redl, P.

Shank, B.

Tomada, A.

Tortorici, E. C.

Yen, J. J.

Young, B. A.

English

arXiv

We report on experimental studies of phonon sensors which utilize quasiparticle diffusion in thin aluminum films connected to tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al films in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al films using a simple diffusion equation approach. These studies allow the design of phonon sensors with improved performance

Young, Betty A.

Cabrera, Blas

Kreikebaum, J. M.

Scholar Commons - Santa Clara University

Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten Transition-Edge Sensors

J. J. Yen

B. Shank

B. A. Young

B. Cabrera

P. L. Brink

M. Cherry

J. M. Kreikebaum

R. Moffatt

P. Redl

A. Tomada

E. C. Tortorici

Crossref

Applied Physics Letters

Measurement of quasiparticle transport in aluminum films using tungsten transition-edge sensors

We report on experimental studies of phonon sensors which utilize quasiparticle diusion in thin aluminum films connected to tungsten transition-edge-sensors (TESs) operated at 35 mK. We show that basic TES physics and a simple physical model of the overlap region between the W and Al lms in our devices enables us to accurately reproduce the experimentally observed pulse shapes from x-rays absorbed in the Al films. We further estimate quasiparticle loss in Al lms using a simple diusion equation approach. These studies allow the design of phonon sensors with improved performance

Yen, Jeffrey

Shank, Benjamin

Young, Betty

Brink, Paul

Cherry, Matthew

Kreikebaum, John Mark

Moffatt, Robert

Redl, Peter

Tomada, Astrid

Tortorici, Ted

Digital Commons@Hope College

https://scholarcommons.scu.edu/cgi/viewcontent.cgi?article=1114&context=physics

Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten
  Transition-Edge Sensors

Measurement Of Quasiparticle Transport In Aluminum Films Using Tungsten Transition-Edge Sensors

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Scholar Commons - Santa Clara University

Crossref

Digital Commons@Hope College