We present a new unit test generator for C code, CTGEN. It generates test
data for C1 structural coverage and functional coverage based on
pre-/post-condition specifications or internal assertions. The generator
supports automated stub generation, and data to be returned by the stub to the
unit under test (UUT) may be specified by means of constraints. The typical
application field for CTGEN is embedded systems testing; therefore the tool can
cope with the typical aliasing problems present in low-level C, including
pointer arithmetics, structures and unions. CTGEN creates complete test
procedures which are ready to be compiled and run against the UUT. In this
paper we describe the main features of CTGEN, their technical realisation, and
we elaborate on its performance in comparison to a list of competing test
generation tools. Since 2011, CTGEN is used in industrial scale test campaigns
for embedded systems code in the automotive domain.Comment: In Proceedings SSV 2012, arXiv:1211.587