High dynamic range test-bed for characterization of analogue-to-digital converters up to 500MSPS

Abstract

Abstract – A measurement set-up of for the characterization of analog-to-digital converters (ADCs) is described. The measurement set-up characterizes ADCs up to 16 bits at 350 MHz (option for>500 MHz). Testing dynamic performance of high-speed ADCs is regarded as difficult and expensive. By using existing state-of-the-art instruments in combination with specially designed amplifiers and filters, a high performance, cost efficient test-bed has been built-up. Practical performance corresponds to ADC datasheet and exceeds the performance obtained if using commercial instruments only. Consequently, the measurement results represent the true performance of the ADC without impact from the test-bed. 1