Implicit Test Pattern Generation Constrained to Cellular Automata Embedding

Abstract

This paper presents an implicit methodology that constrains a test pattern generator to identify test sequences which can be reproduced by cellular automata (CA). The so identified CA can be synthesized as an autonomous finite state machine and can be attached to the inputs of a circuit under test (e.g., a controller). In this way, the circuit under test preserves its integrity and its performance is not affected by the proposed testing technique. The overall device (controller+CA) is an off-line self-testable circuit which can potentially self-test all stuck-at faults both of the controller and the CA. Thus, the method can be viewed as a BIST strategy based on the embedding of deterministic test sequences. 1. Introduction The design of ASICs, particularly in the Telecom field, is often based on medium-size controllers embedded into a complex set of modules. Such controllers usually occupy a fraction of the area of the entire device, but play a key role in the global functionality and..