Concurrent Checking of Sequential Circuits by Alternating Inputs

Abstract

In this paper we investigate how the method of alternating inputs can be applied for concurrent checking of sequential circuits. The state transition function and the output function of the sequential circuit are transformed into corresponding self-dual functions and the memory elements are duplicated. Alternating inputs are submitted to the primary inputs of the sequential circuit. The primary outputs are alternating as long as no error occurs. The error detection probabilities for errors due to single stuck-at faults of the combinational circuits, the memory elements and of the input lines are experimentally determined for benchmark circuits