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Gate-Induced-Drain-Leakage (GIDL) in CMOS Enhanced by Mechanical Stress
Authors
Ingrid De Wolf
Geert Eneman
+6 more
Mario Gonzalez
Alexander Grill
Ben Kaczer
Anastasiia Kruv
Kookjin Lee
Oguzhan Orkut Okudur
Publication date
30 April 2022
Publisher
Doi
Abstract
This work was supported in part by the European Commission through the 7th Framework Program (Collaborative project MORDRED) under Contract 261868
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imec Publications (Interuniversity Microelectronics Centre)
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oai:imec-publications.be:20.50...
Last time updated on 03/12/2024
imec Publications (Interuniversity Microelectronics Centre)
See this paper in CORE
Go to the repository landing page
Download from data provider
oai:imec-publications.be:20.50...
Last time updated on 03/12/2024
