Automating hardware (HW) security vulnerability detection and mitigation
during the design phase is imperative for two reasons: (i) It must be before
chip fabrication, as post-fabrication fixes can be costly or even impractical;
(ii) The size and complexity of modern HW raise concerns about unknown
vulnerabilities compromising CIA triad. While Large Language Models (LLMs) can
revolutionize both HW design and testing processes, within the semiconductor
context, LLMs can be harnessed to automatically rectify security-relevant
vulnerabilities inherent in HW designs. This study explores the seeds of LLM
integration in register transfer level (RTL) designs, focusing on their
capacity for autonomously resolving security-related vulnerabilities. The
analysis involves comparing methodologies, assessing scalability,
interpretability, and identifying future research directions. Potential areas
for exploration include developing specialized LLM architectures for HW
security tasks and enhancing model performance with domain-specific knowledge,
leading to reliable automated security measurement and risk mitigation
associated with HW vulnerabilities