Electrically percolating nanowire networks are amongst the most promising
candidates for next-generation transparent electrodes. Scientific interest in
these materials stems from their intrinsic current distribution heterogeneity,
leading to phenomena like percolating pathway re-routing and localized
self-heating, which can cause irreversible damage. Without an experimental
technique to resolve the current distribution, and an underpinning nonlinear
percolation model, one relies on empirical rules and safety factors to engineer
these materials. We introduce Bose-Einstein microscopy to address the
long-standing problem of imaging active current flow in 2D materials. We report
on improvement of the performance of this technique, whereby observation of
dynamic redistribution of current pathways becomes feasible. We show how this,
combined with existing thermal imaging methods, eliminates the need for
assumptions between electrical and thermal properties. This will enable testing
and modelling individual junction behaviour and hotspot formation.
Investigating both reversible and irreversible mechanisms will contribute to
the advancement of devices with improved performance and reliability