Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnosing bridging faults using single stuck-at dictionaries was applied only to small circuits, produced large and imprecise diagnoses, and did not takeinto account the Byzantine Generals Problem for bridging faults. We analyze the original technique and improveitby introducing the concepts of match restriction, match requirement, and failurerecovery. Our new technique, which requires no information other than that used by standard stuck-at methods, produces diagnoses that are an order of magnitude smaller than those produced by the original technique and produces many fewer misleading diagnoses than that of traditional stuck-at diagnosis. 1 Introduction Accurate fault diagnosis of realistic defects is an integral part of failure analysis. The majorityofspot defects in modern CMOS technologies cause changes in the circuit description that result in electrical shorts #9#, which implies that..
