Electrical Scanning Probe Microscope Measurements Reveal Surprisingly High Dark Conductivity in Y6 and PM6:Y6 and Non-Langevin Recombination in PM6:Y6

Abstract

We used broadband local dielectric spectroscopy (BLDS), an electric force microscopy technique, to make non-contact measurements of conductivity in the dark and under illumination of PM6:Y6 and Y6 prepared on ITO and PEDOT:PSS/ITO. Over a range of illumination intensities, BLDS spectra were acquired and fit to an impedance model of the tip-sample interaction to obtain a sample resistance and capacitance. By comparing two descriptions of cantilever friction, an impedance model and a microscopic model, we connected the sample resistance inferred from impedance modeling to a microscopic sample conductivity. A charge recombination rate was estimated from plots of the conductivity versus light intensity and found to be sub-Langevin. The dark conductivity was orders of magnitude higher than expected from Fermi-level equilibration of the PM6:Y6 with the substrate, suggesting that dark carriers may be a source of open-circuit voltage loss in PM6:Y6