Modeling the wavelength dependence of photo-response non-uniformity of a CCD sensor

Abstract

Precision measurements of astrometry and photometry require stringent control of systematics such as those arising from imperfect correction of sensor effects. In this work, we develop a parametric method to model the wavelength dependence of photo-response non-uniformity (PRNU) for a laser annealed backside-illuminated charge-coupled device. The model accurately reproduces the PRNU patterns of flat-field images taken at nine wavelengths from 290nm to 950nm, leaving the root mean square (RMS) residuals no more than 0.2% in most cases. By removing the large-scale non-uniformity in the flat fields, the RMS residuals are further reduced. This model fitting approach gives more accurate predictions of the PRNU than cubic-spline interpolation does with fewer free parameters. It can be applied to make PRNU corrections for individual objects according to their spectral energy distribution to reduce photometry errors.Comment: 28 pages, 10 figures, comments are welcom

    Similar works

    Full text

    thumbnail-image

    Available Versions