Real-Time SER measurements of CMOS Bulk 40 nm and 65 nm SRAMs combined with neutron spectrometry at the JET Tokamak during D-D and D-T plasma operation

Alia, Ruben Garcia; Autran, Jean-Luc; Bucalossi, Jérome; Cecchetto, Matteo; Contributors, Jet; Dentan, Martin; Horton, Alan R.; Litaudon, Xavier; Malherbe, Victor; Moindjie, Soilihi; Moreau, Philippe; Munteanu, Daniela; Naish, Richard; Rastelli, Dario; Roche, Philippe; Waterhouse, John

Real-Time SER measurements of CMOS Bulk 40 nm and 65 nm SRAMs combined with neutron spectrometry at the JET Tokamak during D-D and D-T plasma operation

Authors: Ruben Garcia Alia
Jean-Luc Autran
Jérome Bucalossi
Matteo Cecchetto
Jet Contributors
Martin Dentan
Alan R. Horton
Xavier Litaudon
Victor Malherbe
Soilihi Moindjie
Philippe Moreau
Daniela Munteanu
Richard Naish
Dario Rastelli
Philippe Roche
John Waterhouse
Publication date: 22 July 2024
Publisher: HAL CCSD

Abstract

International audienceWe performed SER characterization of decananometer SRAMs combined with neutron spectrometry in the deuterium-tritium-fueled JET tokamak, demonstrating the impact of machine operation on the reliability of electronics in conditions approaching those of future fusion reactors

Similar works

Full text

Available Versions

HAL-Rennes 1

oai:HAL:hal-04613462v1

Last time updated on 21/06/2024