Single-specimen J-integral testing is performed commonly with the unloading compliance technique. Use of modern instrumentation techniques and powerful desktop computers have made this technique a standard. However, this testing technique is slow and tedious, with the loading rate fixed at a slow quasi-static rate. For these reasons the dc potential drop technique was investigated for crack length measurement during a J-integral test. For direct comparison, both unloading compliance and potential drop were used simultaneously during a J-integral test. The results showed good agreement between the techniques. However, the potential drop technique showed an offset in crack length due to plastic blunting processes. Taking this offset into account, J/sub Ic/ values calculated by both techniques compared well