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Microscopies à force atomique AFM, DFM, MFM, EFM, LFM
Authors
Ludovic Douillard
Publication date
1 September 2023
Publisher
HAL CCSD
Abstract
MasterMicroscopie à force atomique. Imager une surface via la mesure des forces d’interaction qui s’exercent entre les atomes d’une surface et ceux d’une pointe sonde
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HAL-CEA
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oai:HAL:hal-04487551v1
Last time updated on 25/05/2024