Synchrotron X-ray reflectivity study of Co/Cu multilayer structure

Abstract

We report on the use of Station 2.3 at the SRS Daresbury Laboratory as a high resolution reflectivity diffractometer (HRRD) for the study of interfacial structure in a Co/Cu multilayer grown using the ion-assisted deposition method. Specular, off-specular and diffuse X-ray scattering measurements were obtained from interfaces grown with concurrent ion bombardment under selected deposition conditions. The present work has successfully demonstrated that the HRRD instrument is a viable tool for the structural study of the Co/Cu system. In addition, the reflectivity results have revealed some of the growth mechanisms involved and possible conditions for the optimisation of smooth multilayer interfaces with minimal disorder