Baseline suppression problems for high precision measurements using optical beam profile monitors

Abstract

The use of fluorescent screens (e.g. YAG screens) and Optical Transition Radiation (OTR) screens for beam profile monitors provides a simple and widely used way to obtain detailed two dimensional intensity maps. What makes this possible is the availability of relatively inexpensive CCD cameras. For high precision measurements many possible error contributions need to be considered that have to do with properties of the fluorescent screens and of the CCDs. Saturation effects, reflections within and outside the screen, non-linearities, radiation damage, etc are often mentioned. Here we concentrate on an error source less commonly described, namely erroneous baseline subtraction, which is particularly important when fitting projected images. We show computer simulations as well as measurement results having remarkable sensitivity of the fitted profile widths to even partial suppression of the profile baseline data, which often arises from large pixel-to-pixel variations at low intensity levels. Such inadvertent baseline data suppression is very easy to miss as it is usually not obvious when inspecting projected profiles. In this report we illustrate this effect and discuss possible algorithms to automate the detection of this problem as well as some possible corrective measures

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