Dataset supporting the publication "Mechanical dicing of optical quality facets and waveguides in a Silicon Nitride platform".
This dataset supports the publication:
AUTHORS: Paul C Gow, Glenn M Churchill, Valerio Vitali, Thalia Dominguez Bucio, Frederic Y Gardes, Matthew P. D’Souza, Periklis Petropoulos, Corin B E Gawith and James C Gates
TITLE: Mechanical dicing of optical quality facets and waveguides in a Silicon Nitride platform.
JOURNAL: Electronics Letters
PAPER DOI IF KNOWN: 10.1049/ell2.13138
This zipped dataset contains:
"NCM_3_FAST_Topography_Forward 5.0x5.0"
TIFF file of the topography of one of the machined Silicon Nitride facets measured using a Park Systems Atomis Force Microscope.
"SirichSiN_300nmThickness_TOPWaveguide_TotalTransmissionLosses_meas1"
Microsoft Excel file containing two tabs. "Overview" shows general information of the spectrum analyser used.
"IL" shows wavelength data in column A, and Loss data in Column B.</span