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Growth observations of SiGe/Si islands by means of in-situ x-ray diffraction
Authors
T. Boeck
S. Deiter
+14Â more
C. Eisenschmidt
A.-K. Gerlitzke
M. Hanke
S. Helveg
F. Heyroth
U. Jendritzki
S. Kodambaka
A. Minor
A. Petford-Long
G. Rijnders
G. Schadow
F. Syrowatka
Th. Teubner
A. Ziegler
Publication date
1 January 2009
Publisher
Materials Research Society
Abstract
Abstract is not available.
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DESY
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oai:bib-pubdb1.desy.de:87720
Last time updated on 12/04/2020
DESY Publication Database
See this paper in CORE
Go to the repository landing page
Download from data provider
oai:bib-pubdb1.desy.de:87720
Last time updated on 15/07/2014