This viewgraph presentation reviews the use of Low Voltage Dropout (LVDO) Voltage Regulators in environments where heavy ion induced Single Event Transients are a concern to the designers.Included in the presentation are results of tests of voltage regulators

Karsh, J.

Katz, R.

Kim, H.

Kleyner, I.

LaBel, K.

Poivey, C.

Pursley, S.

Seidleck, C.

NASA Technical Reports Server

I 
Source of Acquisition 1 
NASA Goddard Space Fiight Center 1 
Single Event Transients in Low 
C. Poiveyl, H. Kim', C. Seidleckl, 
J. Karsh2, S. Pursley2,I. Kleyner2, R. Katz 
4v Outline 
Background - Introduction 
Summary of recent test results 
LP4913 
MSK5900 
, b  B X  
Conclusion 5" 
1 
https://ntrs.nasa.gov/search.jsp?R=20060026270 2019-08-29T22:07:02+00:00Z
w Background 
4Er Background 
SET in voltage regulators are a concern for low 
voltage applications (< 5V) 
- Overvoltages may cause destructive conditions 
- Undervoltages may cause functional interrupts 
SET in voltage regulators are critical for FPGA 
2 
@ Summary of test results, RHLP4913 
from STM, Bias condition 
Vin 
0 I 
vout 
v 
RHLP4913 from STM SET cross 
section curves - Effect of load 
X 
9. 100 30.0 40.0 50.0 0 0 70.0. V-  
3 
RHLP4913 from STM SET cross 
section curves - Effect of filter 
I 
1 :  I 
. Ik I 
# RHLP4913 from STM, Typical SETS, 
Cout=lOpF, no filter 
4 
RHLP4913 from STM, Typical SETs, 
Cout=660pF, no filter 
[e RHLP4913 from STM, Typical SETs, 
Cout=l OpF, with filter 
5 
Summary of test results, MSK5900 
from MS Kennedy, Bias condition 1 
0.1 ohm 
Voul 
I I I I -  
@ Summary of test results, MSK5900 
from MS Kennedy, Bias condition 2 
6 
4 
.' 
MSK5900, SET cross section curves 
Vm=3 6V. lload=IOOrnA 
Vm=3 3V. Iload- 100rnA 
A Vm=3,3V. lload=300mA 
0 Vh=3 BV. lload=300rnA 
MSK5900, Typical SETS, RC filter 
MSKS000, Run 261, LET=75 MoVcm'hn~, Viw3.6V, llOrd=lOO mA 
1.75, I 
1 8  
155 
1 5  
-home1dwVul1 
-frmmldm1md3 I 
7 
MSK5900, Typical SETS, 
ferrite based filter 
Runl40. MSKSgOO, Wn=3.2V, lout-S00m& LET=28.8MoVcmz/~ I 
i 
Conclusion 
SET sensitivity changes significantly from type to 
Worst case bias is different from type to type 
Adding up output capacitors is not always 
type 
8 


Single Event Transients in Low Voltage Dropout (LVDO) Voltage Regulators

Single Event Transients in Low Voltage Dropout (LVDO) Voltage Regulators

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