This presentation has been a brief snapshot discussing electronics and Exploration-related challenges. The vision for Space Exploration creates a new paradigm for NASA missions. This includes transport (Crew Exploration Vehicle-CEV), and lunar and Mars Exploration and human presence. If one considers the additional hazards faced by these concepts versus more traditional NASA missions, multiple challenges surface for reliable utilization of electronic parts. The true challenge is to provide a risk as low as reasonably achievable (ALARA-a traditional biological radiation exposure term), while still providing cost effective solutions. This presentation also discusses the hazard for electronic parts and exploration, the types of electronic parts for exploration, and the critical juncture for space usage of commercial changes in the electronics world

LaBel, Kenneth A.

NASA Technical Reports Server

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n w 
Challenges for Electronics in the 1 
Co-Manager, NASA Electronic Parts 
rlEPP) Program 
Project Technologist, Living With a Star Space 
Environment Testbed (LWS SET) 
Group Leader, Radiation Effects and Analysis 
Group, NASNGSFC 
Radiation effects are the prime consideration in 
this talk. Reliability must ALSO be considered. 
rn I 
OU t I ine 
Background - Radiation Effects on Electronics 
Uniqueness of Exploration Systems Missions 
- Typerofmiuions 
- camparison to traditional missions 
ectronic Parb and Exploration 
Sample Electronics Radi;lbion 8nd Reliability ksues that 
impact Space Exploration 
ur-pronged Infrastructure Appmoach 
- Parts Management Process 
- Parts Reliability Capability 
- Radiation Effects Knowledge and Capabilities 
- Exploration-specific Technology Evaluation 
Recommended Investment Areas 
Summary Comments 
Presented by Kenneth Lab1 at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 
https://ntrs.nasa.gov/search.jsp?R=20060004829 2019-08-29T21:16:29+00:00Z
a Radiation Effects and Spacecraft 
Critical areas for design in 
he natural space radiation 
nvironment 
Long-term effects causing 
Displacement damage 
Transient or single parti 
effects (Single event effe 
proton (through nuclear 
interactions) or heavy ion 
(direct deposition) passing 
- 4  1- Total Ionizing Dose (TID) 
. Cumulative long term 
ionizing damage due to 
protons & electrons 
I 
- keV to MeV range 
Electronic Effects 
- hreshold Shifts 
Leakage Current 
- Timing Changes 
krads(materia1' 
Can 
- Reduces low energy protom 
Presented by Kenneth LaBel at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 2 
I# Displacement Damage (DD) 
on-ionizing damage 
,and neutrons 
- I  
I - Single Event Effects (SEES) 
An SEE k caused by a single charged particle as it passer 
thmugh a rremtconductor material I 
energy deposltedllort as a particle passes through a material. 
Effects on electronics - If the LET of the particle (or reaction) is greater than the 
.rmw or critical charge required, an effect may be see . .--,. , . . ._._ ,e-*_, _ _  
Presented by Kenneth LaBel at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 3 
r NASA mission 
If one considers the additional hazards faced b 
exposure term), while still ptwiding cast effedve solutions. 
s for electronic parts relative to traditional NAS 
Presented by Kenneth Lab1 at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 4 
1 w Discussion of the Hazard for 
I '- Etectronic Parts and Exploration I 
Types of Electronic Parts for 
Exploration 
c 
Exploration Systems faces a unique electronic 
parts challenge not only for radiation exposure, 
but for reliability challenges as well. 
- Harsher environment than recent human p r e s e n a  
hazard of traditional earth 
science (interplanetary) 
Cost effectivenes 
I commercial electronics usage to meet 
Is this unique to Exploration? No, but with the hazard 
faced, one must be ca 
performance constraints 
electronic parts reliab 
I to plan for radiation and 
1-1 1 
One may view electronic parts for Exploration as meeting needs in 
three categories 
- Standard electronkr 
E.g.,capa.citocr' - Bulcconpwntr 
- Stadrdbuildlt~gblOCkS 
- Custom devtces not avaihbh as "off-tbhelf" 
* E.Q., nuclear power or EVA 
- Needed for a rpeclflc rpplicatlon 
Note: Commercial-of-the-shelf (COTS) wsealltMiea (e.g-, 
commercial electronic cards or instruments) also may be 
Screening is more complicated than with ISS in this approach due to 
more extreme environment faced 
Infrastructure required to 
parts for Exploration 
Presented by Kenneth LaBel at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 5 
A Critical Juncture for Space Usage - 
-Commercial Changes in the Electronics World . Wte past decade plus, much has changed 
in the semiconductor world. Among the rapid 
Scaling of technology 
Increased gatelcell density per unit area 
well as power and thermal densities) 
Changes in power supply and logic voltages 
- Reduced electrical muglns within a single IC 
Increased device compiexity, I of gates, and 
hidden features 
Use of antifuse structures, phasechange 
Speeds to >> GHz (CMOS, SiGe, InP ...) 
Changes in materials 
materials, alternative K dielectrics, Cu 
interconnects (previous - AI), insulating 
substrates, ultra-thin oxides, etc ... 
increased Inputloutput (UO) In packaging 
Use of flip-chip, area array packages, etc 
Increased importance of application speci 
usage to reliabilitylradiation performance 
~ 
l",---S---.-- 
",%3 c a  
Presented by Kenneth Lab1 at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 6 
NASA 3 Implications for Electronics in Space 
mdC-eSrsngerihthr 1W.l-w- 
ryiniconductor world, wha$areth. 
- implications for usage in sp-7 
Implications for test, usage, 
qualification and more 
Speed, power, thermal, packaging, 
geometry, materials, and faulthilur 
isolation are just a few for emerging 
challenges for radiation test and 
Reliability challenges are equally aa 
great 
chart (courtesy of 
Vanderbilt University) looks at some 01 
the recent examples of test data that 
imply shortfalls in existing radiation 
ow 
Sample Modeling Shortfalls 
slwmn On Insulator 
Presented by Kenneth Lab1 at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 7 
- 
b h r r e n t  Status of Radiation Knowledge , , J-Amm-:A.m C n  r, 7 NASA,(  
KaUIatlo u a  odeling K 
mulation ResDons, Ba 
I sEu-u 
Yu Y u  
Approach to Electronic Parts 
Assurance for Exploration 
What follows is a recommended four-prong approach 
e NOT specific to a 
- What Is being mommonded is compkmrncllry to NEPP 
#her alliances with flight testbeds such as LWS SE 
llllenlum are also encouraged 
he four prongs for electronic parts assu 
Parts management and control 
Reliability test and analysis capability 
Radiation effects test and analysis capability 
xploration-spdfic technology evaluation 
ce are 
'nvironment models are outside of traditional parts ass( 
!-ut recommendations will be made later in presentation 
Presented by Kenneth LaBel at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 8 
I 
Parts Management and Control 
I Support coordination, management, and control of electronic parts as related to Exploration Missions 
Support infrastructure issues required for successful 
electronic parts utilization 
- Vendor audits, standards committees, etc 
pport at each center (min. 1 FTEDUYE per) 
Complex new FPGA architectures Include 
nard-cores: processing, high-peed 110, DSPa, 
prwrammable loglc, and conflguratlon latches 
I eliability Test and Analysis 
cture to support new and 
K e e p s  labs "stateOf-the9rt" 
Recommendation 
- Utiliu existlna stmnaths at GSFC. JPL. GRC. MSFC, ARC, 
LaRC, and JSE. ExaGples, 
GSFC and JPL are MAIN strengths far marts reliabilitv efforts for 
ORC has capability for ertreme temp, power, ana Rb 
MSFC and JSC have hlstorical base for electronics for human I . . . , _ .  m . .  . .... . prmanm miulonr 
Presented by Kenneth LaBel at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 9 
Radiation Effects Test and Analysis 
Goal: Ptavtde detkated infrastructure to support new and 
existing device evaluation for radiation specific issues 
- Provide a quick-turn capability for gathering radiation 
knowledge on technologies of interest to Exploration -- Keep evaluation capabilities on par with commercial 
technology advances 
I 
Allows costeffective evaluation of space-specific issues 
that developed 
Utilize existing strength 
-0 GSFC and JPL are recoa 
ttw agency (and the aem 
electrMlics 
-0 JSC has historical base for human presence coupled with 
- Support high energy heavy ion test facility at MSU for 
commercial devicelassembly evaluation I p u r c b  of time for Exploration technolopies 
WPluatiOM 
Evaluation of Technologies 
Specific to Exploration I- . Goal: Provide evaluation 
of technologies of specific 
iterest to Exploration 
- High and cold temperature 
I -  
n 
- Long-life 
- Nuclear expolb1re, etc. 
- Utilize strengths at GSFC, 
I 
Recommendatian 
1 JPL, GRC, MSFC, 
ARC, and JSC 
ial 
I 
1 ;  
I 
Presented by Kenneth LaBel at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 10 
lw Electronics and Radiation Environment 
Investment Areas 
Pacts 
Small probability riak analysis (if 1 in 1eS p a r t l c i e t d Y P ~ n a N m ? , W 1 , d e  
we teat. madel. and internlet for svstem risk?) 
el 
Absorption Lase 
evices 
meaningful answer 
- Provide an answer to shortfalls in tools such as CREMES6 
- Development of substrate engineering processing 
aeneratlon and enhance recombination in CMOS 
Radiation hardening of devices 
improved radiation hardening of sensorsldetectors 
- System rlsk rnrlyslr requirec thia 
* Improved solar heavy ion model 
Update to AE8 and AP-8 r -  important to CEV and phasing orblb I Standard radiation environment “engineeringgrade” sensor for all 
has been a brief snapshot 
ronics and Exploration-related 
- Radiation effects have been the prime target, however, 
electronic parts reliability issues must also be 
electronics are designed with a 3-5 year li 
08s not improve reliability, merely 
I h the uniqueness of the Exploration program infrastructure and commensurate targeted research are suggested. 
I 
Presented by Kenneth LaBel at the Solar and Space Physics for the Vision for Space Exploration (SSPVSE), 
Charlottesville, Virginia, Oct. 16-20,2005. 11 


Challenges for Electronics in the Vision for Space Exploration

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